Found 9 Documents (Results 1–9)
Spatial scan density estimates. (English) Zbl 1072.62559
MSC:
62G07
Markov random fields in pattern recognition for semiconductor manufacturing. (English) Zbl 1072.60502
Using the folded-over 12-run Plackett-Burman design to consider interactions. (English) Zbl 1072.62622
MSC:
62K15
Noncentral composite designs. (English) Zbl 1072.62624
MSC:
62K99
Multistratum response surface designs. (English) Zbl 1072.62623
MSC:
62K20
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