Huang, Yuanjie Electric features of dislocations and electric force between dislocations. (English) Zbl 07357419 Math. Mech. Solids 26, No. 4, 616-628 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI
Athanker, Prashant; Singh, Amit Kumar Elastic and elasto-plastic analysis of Ti6Al4V micro-lattice structures under compressive loads. (English) Zbl 07357418 Math. Mech. Solids 26, No. 4, 591-615 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI
Pavlovna Romanova, Tatiana Modeling the dynamic bending of rigid-plastic fiber-reinforced laminated curvilinear doubly connected thin plates with free outer contour. (English) Zbl 07357417 Math. Mech. Solids 26, No. 4, 570-590 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI
Galadima, Yakubu Kasimu; Oterkus, Erkan; Oterkus, Selda Model order reduction of linear peridynamic systems using static condensation. (English) Zbl 07357416 Math. Mech. Solids 26, No. 4, 552-569 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI OA License
Yang, Zhenghao; Oterkus, Erkan; Oterkus, Selda A state-based peridynamic formulation for functionally graded Kirchhoff plates. (English) Zbl 07357415 Math. Mech. Solids 26, No. 4, 530-551 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI OA License
Böhmer, Christian G.; Lee, Yongjo Compatibility conditions of continua using Riemann-Cartan geometry. (English) Zbl 07357414 Math. Mech. Solids 26, No. 4, 513-529 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI arXiv OA License
Hrytsyna, Olha Local gradient Bernoulli-Euler beam model for dielectrics: effect of local mass displacement on coupled fields. (English) Zbl 07357413 Math. Mech. Solids 26, No. 4, 498-512 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI
Malin, Maria; Mardare, Cristinel Estimates for the constant in two nonlinear Korn inequalities. (English) Zbl 07357412 Math. Mech. Solids 26, No. 4, 471-497 (2021). MSC: 74-XX × Cite Format Result Cite Review PDF Full Text: DOI