Modarres, M.; Dezfuli, H. A truncation methodology for evaluating large fault trees. (English) Zbl 0552.90042 IEEE Trans. Reliab. 33, 325-328 (1984). MSC: 90B25 × Cite Format Result Cite Review PDF Full Text: DOI
Ikebe, Yasuhiko; Inagaki, Toshiyuki An error analysis for reliability quantification. (English) Zbl 0501.90048 IEEE Trans. Reliab. 31, 385-388 (1982). MSC: 90B25 62N05 65C99 × Cite Format Result Cite Review PDF Full Text: DOI
Heidtmann, Klaus D. Improved method of inclusion-exclusion applied to k-out-of-n systems. (English) Zbl 0481.90030 IEEE Trans. Reliab. 31, 36-40 (1982). MSC: 90B25 × Cite Format Result Cite Review PDF Full Text: DOI
Niculescu, P. Stefan; Saganai, Nuesfet; Wiener, Ulrich On some nonclassical reliability indicators for measure instruments. (Romanian) Zbl 0479.90045 Stud. Cercet. Mat. 33, 619-626 (1981). MSC: 90B25 60J05 × Cite Format Result Cite Review PDF
Bondarenko, A. I.; Savin, S. K. Estimating the serviceability of technical systems. (English. Russian original) Zbl 0465.90036 Autom. Remote Control 15, No. 1, 135-138 (1981); translation from Avtom. Vychisl. Tekh. 1981, No. 1, 166-181 (1981). MSC: 90B25 × Cite Format Result Cite Review PDF
Lee, Keun K. A compilation technique for exact system reliability. (English) Zbl 0461.90037 IEEE Trans. Reliab. 30, 284-288 (1981). MSC: 90B25 × Cite Format Result Cite Review PDF Full Text: DOI
Smith, Arthur L. Hard and soft failures in dynamic RAM fault tolerant memories. (English) Zbl 0457.60059 IEEE Trans. Reliab. 30, 58-60 (1981). MSC: 60K10 62N05 68W99 90B25 × Cite Format Result Cite Review PDF Full Text: DOI
Schneeweiß, W. G. On the number of defective system’s components or erroneous bits in binary coding. (English) Zbl 0455.94054 Z. Oper. Res., Ser. B. 25, 49-53 (1981). MSC: 94C12 62N05 94B70 90B25 × Cite Format Result Cite Review PDF Full Text: DOI
Nakagawa, Yuji; Miyazaki, Satoshi An experimental comparison of the heuristic methods for solving reliability optimization problems. (English) Zbl 0455.90035 IEEE Trans. Reliab. 30, 181-184 (1981). MSC: 90B25 90C90 65K05 68Q25 × Cite Format Result Cite Review PDF Full Text: DOI
Kittler, J.; Pau, L. F. Automatic inspection by lots in the presence of classification errors. (English) Zbl 0461.62081 Pattern Recognition 12, 237-241 (1980). MSC: 62P30 62H30 × Cite Format Result Cite Review PDF Full Text: DOI
Fujiwara, Hideo; Kinoshita, Kozo Connection assignments for probabilistically diagnosable systems. (English) Zbl 0371.94048 IEEE Trans. Comput. 27, 280-283 (1978). MSC: 94C10 94B99 68Q45 90B25 × Cite Format Result Cite Review PDF Full Text: DOI
Maheshwari, Shachindra N.; Hakimi, S. Louis On models for diagnosable systems and probabilistic fault diagnosis. (English) Zbl 0339.68047 IEEE Trans. Comput. 25, 228-236 (1976). MSC: 68Q45 94C10 94B99 90B25 × Cite Format Result Cite Review PDF Full Text: DOI