Estimation of archival lifetime distribution for writable optical disks from accelerated testings. (English) Zbl 1407.62379
Rykov, Vladimir V. (ed.) et al., Mathematical and statistical models and methods in reliability. Applications to medicine, finance, and quality control. Invited papers based on the presentation at the 6th international conference (MMR 2009), Moscow, Russia, June 22–26, 2009. Boston, MA: Birkhäuser. Stat. Ind. Technol., 307-313 (2010).
Summary: ISO/IEC 10995:2008 specifies a procedure for estimating the distribution of archival lifetimes of optical disks from accelerated lifetime test results. In this article we derive the maximum likelihood estimator of the lifetime distributions based on an accelerated lifetime model, an Eyring model, and lognormal distribution, from a reliability engineering perspective. We also propose a procedure to analyze a data set from an accelerated lifetime test.
For the entire collection see [Zbl 1203.60007].
For the entire collection see [Zbl 1203.60007].
MSC:
| 62N05 | Reliability and life testing |
| 62P30 | Applications of statistics in engineering and industry; control charts |
Software:
SPLIDAReferences:
| [1] | ISO/IEC: Information Technology - Digitally recorded media for information interchange and storage - Test method for the estimation of the archival lifetime of optical media, ISO/IEC (2008) |
| [2] | Meeker, W. Q. and Escobar, L. A.: Statistical Methods for Reliability Data, Wiley, New York (1998) · Zbl 0949.62086 |
| [3] | Bagdonavic̆ious, V. and Nikulin, M.: Accelerated Life Models: Modeling and statistical analysis, Chapman & Hall/CRC, Boca Raton (2002) · Zbl 1001.62035 |
| [4] | Lawless, J. F.: Statistical Models and Methods for Lifetime Data, 2nd Ed., Wiley, New York (2003) · Zbl 1015.62093 |
| [5] | Escobar, L. A. and Meeker, W. Q. : Planning accelerated life tests with two or more experimental factors. Technometrics, 37, 411-427 (1995) · Zbl 0862.62072 · doi:10.1080/00401706.1995.10484374 |
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