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Kim, Chul

MTBF of a complex binary coherent system. (English) Zbl 0691.60075

IEEE Trans. Reliab. 38, No. 4, 411-415 (1989).

MSC:

60K10 Applications of renewal theory (reliability, demand theory, etc.)
90B25 Reliability, availability, maintenance, inspection in operations research

Keywords:

minimal path set; new better than used distribution; increasing failure rate distribution; mean time between failures; component failure; system failure
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