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Some properties of a generalized logistic distribution for reliability and life-testing applications. (English) Zbl 0615.62125

Three different ways (compounding, beta transform, and order statistics) to derive a reparametrized form (g-log) of the Verhulst generalized logistic growth curve, are taken to characterize this g-log and thus its life-time transforms, especially some generating function and hazard rate properties (recursive, MIFR, asymptotically constant).
Two limiting forms of the g-log are derived demonstrating the close relation to standard life-time models: the exponential and the extreme- value distribution. Relations to other standard probability models are shown.

MSC:

62N05 Reliability and life testing
60E05 Probability distributions: general theory