Miller, Robert; Nelson, Wayne Optimum simple step-stress plans for accelerated life testing. (English) Zbl 0513.62094 IEEE Trans. Reliab. 32, 59-65 (1983). Page: −5 −4 −3 −2 −1 ±0 +1 +2 +3 +4 +5 Show Scanned Page Cited in 78 Documents MSC: 62N05 Reliability and life testing Keywords:optimum step-stress plans; accelerated life testing; exponential life distribution; maximum likelihood estimation; time-step test; failure-step test; asymptotic variance; constant-stress test × Cite Format Result Cite Review PDF Full Text: DOI