Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture (Q50455654)
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scientific article published on 5 November 2008
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture |
scientific article published on 5 November 2008 |
Statements
Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture (English)
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Elizabeth Schroeder-Reiter
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Fabián Pérez-Willard
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Ulrike Zeile
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Gerhard Wanner
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5 November 2008
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165
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2
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97-106
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Identifiers
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