Beyerer, Jürgen, Hagmanns, Raphael and Stadler, Daniel.
Pattern Recognition: Introduction, Features, Classifiers and Principles, Berlin, Boston: De Gruyter Oldenbourg, 2024.
https://doi.org/10.1515/9783111339207
Beyerer, J., Hagmanns, R. & Stadler, D. (2024).
Pattern Recognition: Introduction, Features, Classifiers and Principles. Berlin, Boston: De Gruyter Oldenbourg.
https://doi.org/10.1515/9783111339207
Beyerer, J., Hagmanns, R. and Stadler, D. 2024.
Pattern Recognition: Introduction, Features, Classifiers and Principles. Berlin, Boston: De Gruyter Oldenbourg.
https://doi.org/10.1515/9783111339207
Beyerer, Jürgen, Hagmanns, Raphael and Stadler, Daniel.
Pattern Recognition: Introduction, Features, Classifiers and Principles. Berlin, Boston: De Gruyter Oldenbourg, 2024.
https://doi.org/10.1515/9783111339207
Beyerer J, Hagmanns R, Stadler D.
Pattern Recognition: Introduction, Features, Classifiers and Principles. Berlin, Boston: De Gruyter Oldenbourg; 2024.
https://doi.org/10.1515/9783111339207
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