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Influence of the driver and active load threshold voltage in design of pseudo-NMOS logic. (English) Zbl 1231.94099

Mastorakis, N. (ed.) et al., Latest trends on circuits. Papers based on the presentations at the 14th WSEAS international conference on circuits (Part of the 14th WSEAS CSCC multiconference), Corfu Island, Greece, July 22–24, 2010. Athens: World Scientific and Engineering Academy and Society (WSEAS) (ISBN 978-960-474-206-6/CD-ROM; 978-960-474-198-4). 110-115 (2010).
Summary: During the design phase of different logic gates based on MOS technologies, it is necessary to take into consideration many parameters which characterise MOS transistors. One of the parameters which characterizes all types of MOSFET transistors is the threshold voltage that has impact in static and dynamic performances of the different logic gates.
The aim of this paper is to research the impact threshold voltage of NMOS (driver) and PMOS (active load) transistors during the design phase of pseudo-NMOS inverters and in pseudo-NMOS logic gates which perform specific logic functions. The results obtained emphasize the impact of each single value of the threshold voltage at the low level of the output voltage, at the level values of static current at output and on the shape of the voltage transfer characteristic in the pseudo-NMOS inverter and pseudo-NMOS logic gates. By adjusting the threshold voltage values of NMOS and PMOS transistor it’s possible to design pseudo-NMOS logic gate which will have acceptable performance depending on designers’ requests.
For the entire collection see [Zbl 1204.94005].

MSC:

94C10 Switching theory, application of Boolean algebra; Boolean functions (MSC2010)
94C30 Applications of design theory to circuits and networks