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Reliability assessment for products with two performance characteristics based on marginal stochastic processes and copulas. (English) Zbl 1497.62262

Summary: Many highly reliable products (systems) usually have multiple dependent degradation processes because of their complex structure. Therefore, it is important to investigate the multivariate degradation models along with the reliability assessment in the stochastic modeling. This article proposes a framework for bivariate degradation modeling based on hybrid stochastic processes for products with two performance characteristics (PCs), the dependence of which is captured by copula functions. Considering heterogeneities among product units, different random effects are introduced in marginal stochastic processes. Then two classes of reliability functions based on joint posterior distributions are derived. In addition, a simulation study indicates that the holistic Bayesian parameter estimation method is better than the two-step Bayesian parameter estimation method. Finally, this article concludes with a case application to demonstrate the effectiveness of the proposed model.

MSC:

62N05 Reliability and life testing
62F15 Bayesian inference
62M05 Markov processes: estimation; hidden Markov models
62P30 Applications of statistics in engineering and industry; control charts

Software:

copula; BUGS; copula
Full Text: DOI

References:

[1] Chen, X.; Sun, X.; Ding, X.; Tang, J., The inverse Gaussian process with a skew-normal distribution as a degradation model, Communications in Statistics - Simulation and Computation, 1-17 (2019) · Zbl 1489.62312 · doi:10.1080/03610918.2018.1527351
[2] Deng, Y.; Barros, A.; Grall, A., 2013 Prognostics and Health Management Conference (PHM), Volume 33 of Chemical Engineering Transactions, Residual useful life estimation based on a time-dependent Ornstein-Uhlenbeck process, 325-30 (2013), IEEE: AIDIC SERVIZI SRL, IEEE
[3] Deng, Y.; Barros, A.; Grall, A., 2014 60th Annual Reliability and Maintainability Symposium (RAMS), Reliability and Maintainability Symposium, Calculation of failure level based on inverse first passage problem, 1-6 (2014), Colorado Springs, CO, USA: IEEE, Colorado Springs, CO, USA
[4] Deng, Y.; Barros, A.; Grall, A., Degradation modeling based on a time-dependent Ornstein-Uhlenbeck process and residual useful lifetime estimation, IEEE Transactions on Reliability, 65, 1, 126-40 (2016) · doi:10.1109/TR.2015.2462353
[5] Doksum, K. A.; Hoyland, A., Models for variable-stress accelerated life testing experiments based on Wiener-processes and the inverse Gaussian distribution, Technometrics, 34, 1, 74-82 (1992) · Zbl 0763.62048 · doi:10.2307/1269554
[6] Doksum, K. A.; Normand, S.-L T., Gaussian models for degradation processes-part I: Methods for the analysis of biomarker data, Lifetime Data Analysis, 1, 2, 131-44 (1995) · Zbl 0836.62098 · doi:10.1007/BF00985763
[7] Duan, F.; Wang, G.; Wang, H., Inverse Gaussian process models for bivariate degradation analysis: A Bayesian perspective, Communications in Statistics - Simulation and Computation, 47, 1, 166-86 (2018) · Zbl 1392.62070 · doi:10.1080/03610918.2017.1280162
[8] Hamada, M. S.; Wilson, A.; Reese, C. S.; Martz, H., Springer series in statistics, Bayesian reliability (2008), New York: Springer, New York · Zbl 1165.62074
[9] Joe, H.; Xu, J. J., The estimation method of inference functions for margins for multivariate models (1996)
[10] Kruschke, J. K., Doing Bayesian data analysis: A tutorial with R and BUGS (2011), Oxford: Academic Press, Oxford · Zbl 1301.62001
[11] Liu, T.; Pan, Z.; Sun, Q.; Feng, J.; Tang, Y., Residual useful life estimation for products with two performance characteristics based on a bivariate Wiener process, Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability, 231, 1, 69-80 (2017) · doi:10.1177/1748006X16683317
[12] Liu, Z.; Ma, X.; Yang, J.; Zhao, Y., Reliability modeling for systems with multiple degradation processes using inverse Gaussian process and copulas, Mathematical Problems in Engineering, 2014, 1-10 (2014) · Zbl 1407.62375 · doi:10.1155/2014/829597
[13] Nelsen, R. B., Springer series in statistics, An introduction to Copulas (2006), New York: Springer, New York · Zbl 1152.62030
[14] Pan, Z.; Balakrishnan, N., Reliability modeling of degradation of products with multiple performance characteristics based on gamma processes, Reliability Engineering & System Safety, 96, 8, 949-57 (2011) · doi:10.1016/j.ress.2011.03.014
[15] Pan, Z.; Balakrishnan, N.; Sun, Q., Bivariate constant-stress accelerated degradation model and inference, Communications in Statistics-Simulation and Computation, 40, 2, 259-69 (2011)
[16] Pan, Z.; Balakrishnan, N.; Sun, Q.; Zhou, J., Bivariate degradation analysis of products based on Wiener processes and copulas, Journal of Statistical Computation and Simulation, 83, 7, 1316-29 (2013) · Zbl 1431.62461 · doi:10.1080/00949655.2012.658805
[17] Pan, Z.; Sun, Q., Optimal design for step-stress accelerated degradation test with multiple performance characteristics based on gamma processes, Communications in Statistics - Simulation and Computation, 43, 2, 298-314 (2014) · Zbl 1333.62307 · doi:10.1080/03610918.2012.700749
[18] Pan, Z.; Sun, Q.; Feng, J., Reliability modeling of systems with two dependent degrading components based on gamma processes, Communications in Statistics - Theory and Methods, 45, 7, 1923-38 (2016) · Zbl 1338.62197 · doi:10.1080/03610926.2013.870201
[19] Peng, C.-Y., Inverse Gaussian processes with random effects and explanatory variables for degradation data, Technometrics, 57, 1, 100-11 (2015) · doi:10.1080/00401706.2013.879077
[20] Peng, C.-Y.; Tseng, S.-T., Mis-specification analysis of linear degradation models, IEEE Transactions on Reliability, 58, 3, 444-55 (2009)
[21] Peng, C.-Y.; Tseng, S.-T., Statistical lifetime inference with skew-Wiener linear degradation models, IEEE Transactions on Reliability, 62, 2, 338-50 (2013)
[22] Peng, W.; Li, Y.-F.; Mi, J.; Yu, L.; Huang, H.-Z., Reliability of complex systems under dynamic conditions: A Bayesian multivariate degradation perspective, Reliability Engineering & System Safety, 153, 75-87 (2016) · doi:10.1016/j.ress.2016.04.005
[23] Peng, W.; Li, Y.-F.; Yang, Y.-J.; Huang, H.-Z.; Zuo, M. J., Inverse Gaussian process models for degradation analysis: A Bayesian perspective, Reliability Engineering & System Safety, 130, 175-89 (2014) · doi:10.1016/j.ress.2014.06.005
[24] Peng, W.; Li, Y.-F.; Yang, Y.-J.; Mi, J.; Huang, H.-Z., Bayesian degradation analysis with inverse Gaussian process models under time-varying degradation rates, IEEE Transactions on Reliability, 66, 1, 84-96 (2017) · doi:10.1109/TR.2016.2635149
[25] Peng, W.; Li, Y.-F.; Yang, Y.-J.; Zhu, S.-P.; Huang, H.-Z., Bivariate analysis of incomplete degradation observations based on inverse Gaussian processes and copulas, IEEE Transactions on Reliability, 65, 2, 624-39 (2016) · doi:10.1109/TR.2015.2513038
[26] Peng, W.; Ye, Z.-S.; Chen, N., Joint online RUL prediction for multi-deteriorating systems, IEEE Transactions on Industrial Informatics, 15, 5, 2870-2878 (2018)
[27] Pulcini, G., A perturbed gamma process with statistically dependent measurement errors, Reliability Engineering & System Safety, 152, 296-306 (2016) · doi:10.1016/j.ress.2016.03.024
[28] Rodríguez-Picón, L. A., Reliability assessment for systems with two performance characteristics based on gamma processes with marginal heterogeneous random effects, Eksploatacja i Niezawodnosc - Maintenance and Reliability, 19, 1, 8-18 (2016) · doi:10.17531/ein.2017.1.2
[29] Rodríguez-Picón, L. A.; Flores-Ochoa, V. H.; Méndez-González, L. C.; Rodríguez-Medina, M. A., Bivariate degradation modelling with marginal heterogeneous stochastic processes, Journal of Statistical Computation and Simulation, 87, 11, 2207-26 (2017) · Zbl 07192059 · doi:10.1080/00949655.2017.1324858
[30] Rodríguez-Picón, L. A.; Rodríguez-Picón, A. P.; Alvarado-Iniesta, A., Degradation modeling of 2 fatigue-crack growth characteristics based on inverse Gaussian processes: A case study, Applied Stochastic Models in Business and Industry, 35, 3, 504-521 (2018) · Zbl 07883108
[31] Sari, J. K.; Newby, M. J.; Brombacher, A. C.; Tang, L. C., Bivariate constant stress degradation model: LED lighting system reliability estimation with two-stage modelling, Quality and Reliability Engineering International, 25, 8, 1067-84 (2009) · doi:10.1002/qre.1022
[32] Shu, Y.; Feng, Q.; Kao, E. P. C.; Liu, H., Levy-driven non-Gaussian Ornstein-Uhlenbeck processes for degradation-based reliability analysis, IIE Transactions, 48, 11, 993-1003 (2016) · doi:10.1080/0740817X.2016.1172743
[33] Si, X.; Li, T.; Zhang, Q., A general stochastic degradation modeling approach for prognostics of degrading systems with surviving and uncertain measurements, IEEE Transactions on Reliability, 68, 3, 1080-100 (2019) · doi:10.1109/TR.2019.2908492
[34] Si, X.-S.; Wang, W.; Hu, C.-H.; Zhou, D.-H.; Pecht, M. G., Remaining useful life estimation based on a nonlinear diffusion degradation process, IEEE Transactions on Reliability, 61, 1, 50-67 (2012) · doi:10.1109/TR.2011.2182221
[35] Spiegelhalter, D. J.; Best, N. G.; Carlin, B. P.; Van Der Linde, A., Bayesian measures of model complexity and fit, Journal of the Royal Statistical Society: Series B (Statistical Methodology), 64, 4, 583-639 (2002) · Zbl 1067.62010 · doi:10.1111/1467-9868.00353
[36] Tsai, C.-C.; Tseng, S.-T.; Balakrishnan, N., Mis-specification analyses of gamma and Wiener degradation processes, Journal of Statistical Planning and Inference, 141, 12, 3725-35 (2011) · Zbl 1235.62130 · doi:10.1016/j.jspi.2011.06.008
[37] Tsai, C. C.; Tseng, S. T.; Balakrishnan, N., Optimal design for degradation tests based on gamma processes with random effects, IEEE Transactions on Reliability, 61, 2, 604-13 (2012) · doi:10.1109/TR.2012.2194351
[38] Wang, D.; Tsui, K.-L., Brownian motion with adaptive drift for remaining useful life prediction: Revisited, Mechanical Systems and Signal Processing, 99, 691-701 (2018) · doi:10.1016/j.ymssp.2017.07.015
[39] Wang, X., Wiener processes with random effects for degradation data, Journal of Multivariate Analysis, 101, 2, 340-51 (2010) · Zbl 1178.62091 · doi:10.1016/j.jmva.2008.12.007
[40] Wang, X.; Balakrishnan, N.; Guo, B., Mis-specification analyses of nonlinear Wiener process-based degradation models, Communications in Statistics - Simulation and Computation, 45, 3, 814-32 (2016) · Zbl 1489.62321 · doi:10.1080/03610918.2013.875566
[41] Wang, X.; Balakrishnan, N.; Guo, B.; Jiang, P., Residual life estimation based on bivariate non-stationary gamma degradation process, Journal of Statistical Computation and Simulation, 85, 2, 405-21 (2015) · Zbl 1457.62325 · doi:10.1080/00949655.2013.824448
[42] Wang, X.; Guo, B.; Cheng, Z., Residual life estimation based on bivariate Wiener degradation process with time-scale transformations, Journal of Statistical Computation and Simulation, 84, 3, 545-63 (2014) · Zbl 1453.62700 · doi:10.1080/00949655.2012.719026
[43] Wang, X.; Guo, B.; Cheng, Z.; Jiang, P., Residual life estimation based on bivariate Wiener degradation process with measurement errors, Journal of Central South University, 20, 7, 1844-51 (2013) · doi:10.1007/s11771-013-1682-9
[44] Wang, X.; Hu, C.; Si, X.; Pang, Z.; Ren, Z., An adaptive remaining useful life estimation approach for newly developed system based on nonlinear degradation model, IEEE Access, 7, 82162-73 (2019) · doi:10.1109/ACCESS.2019.2924148
[45] Wei, Q.; Xu, D., Remaining useful life estimation based on gamma process considered with measurement error, 645-9 (2014), IEEE
[46] Yan, J., Enjoy the joy of Copulas: With a package copula, Journal of Statistical Software, 21, 4, 1-21 (2007) · doi:10.18637/jss.v021.i04
[47] Ye, Z.-S.; Chen, N., The inverse Gaussian process as a degradation model, Technometrics, 56, 3, 302-11 (2014) · doi:10.1080/00401706.2013.830074
[48] Ye, Z.-S.; Chen, N.; Shen, Y., A new class of Wiener process models for degradation analysis, Reliability Engineering & System Safety, 139, 58-67 (2015) · doi:10.1016/j.ress.2015.02.005
[49] Ye, Z.-S.; Xie, M., Stochastic modelling and analysis of degradation for highly reliable products, Applied Stochastic Models in Business and Industry, 31, 1, 16-32 (2015) · Zbl 07883190 · doi:10.1002/asmb.2063
[50] Zhai, Q.; Ye, Z.-S., RUL prediction of deteriorating products using an adaptive Wiener process model, IEEE Transactions on Industrial Informatics, 13, 6, 2911-21 (2017) · doi:10.1109/TII.2017.2684821
[51] Zhou, J.; Pan, Z.; Sun, Q., Bivariate degradation modeling based on gamma process, III, 1783-8 (2010), London, United Kingdom
[52] Zhou, Y.; Ma, L.; Mathew, J.; Kim, H.; Wolff, R., Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, Vols I and II: Highly Reliable, Easy to Maintain and Ready to Support, Asset life prediction using multiple degradation indicators and lifetime data: A gamma-based state space model approach, 445-9 (2009), New York, USA: Chinese Soc Aeronaut & Astronaut, IEEE Reliabil Soc, IEEE, New York, USA
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