Lijst van analysemethoden voor materialen

Dit is een lijst van karakteriserings- en analysemethoden voor materialen en hun structuren. De technieken zijn essentieel in het vakgebied der materiaalkunde, maar worden ook veel toegepast in de vastestoffysica en analytische chemie. De analysemethoden worden weergegeven op basis van hun acroniem, indien aanwezig, en staan op alfabetische volgorde. Synoniemen zijn aangegeven en analysemethoden, die alleen als toevoeging op een andere methode mogelijk zijn, zijn aangegeven met "zie hoofdtechniek".

A · B · C · D · E · F · G · H · I · J · K · L · M · N · O · P · Q · R · S · T · U · V · W · X · Y · Z · Symbolen

A

AAS – Atomaire-absorptiespectrometrie
AED – Auger-elektrondiffractie
AES – Auger-elektronspectroscopie
AES – Atomaire emissie spectroscopie, synoniem met OES
AFM – Atoomkrachtmicroscopie
AFS of FCM – Fluorescentiespectroscopie
APFIM – Atom probe field ion microscopie
APS – Appearance potential spectroscopie
ARPES – Angle resolved photoemission spectroscopie, synoniem met ARUPS
ARUPS – Angle resolved ultraviolet photoemission spectroscopie
ATR – Attenuatie van de totale reflectie
AUC – Analytische ultracentrifugatie

B

BET – BET surface area measurement (BET van Brunauer, Emmett, Teller)
BiFC – Bimolecular fluorescence complementation
BKD – Backscatter Kikuchi diffraction, zie EBSD
BRET – Förster resonance energy transfer
BSED – Back scattered electron diffraction, synoniem van EBSD

C

CAICISS – Coaxial impact collision ion scattering spectroscopie
CARS – Coherent anti-Stokes Ramanspectroscopie
CBED – Convergent beam electron diffraction
CCM – Charge collection microscopie, zie EM
CDI – Coherent diffraction imaging
CE – Capillaire elektroforese
CET – Cryo-elektronentomografie, ET
CL – Kathodeluminescentie
CLSM – Confocal laser scanning microscopie
COSY – Correlatie spectroscopie
CR – Cyclotron resonance
Cryo-EM – Cryo-elektronenmicroscopie, zie EM
Cryo-SEM – Cryo-rasterelektronenmicroscopie, zie SEM
CV – Cyclovoltammetrie

D

DDC – Dynamische differentiecalorimetrie
DE(T)A – Diëlektrische thermische analyse
dHvA – De Haas–van Alphen-analyse
DIC – Differentiële interferentiecontrastmicroscopie
Diëlektrische spectroscopie
DLS – Dynamische lichtverstrooiing
DLTS – Transiënte spectroscopie op diep niveau
DMA, DMTA of DTMA – Dynamisch-mechanische analyse of dynamische thermo-mechanische analyse
DPI – Interferometrie met dubbele polarisatie
DRS – Diffuse reflectiespectroscopie
DSC – Dynamische differentiecalorimetrie
DTA – Differentiële thermische analyse
DVS – Dynamische dampsorptie

E

EBIC – Electron beam induced current, zie IBIC
EBS – Elastische (niet-Rutherford) backscattering spectrometrie, zie RBS
EBSD – Electron backscatter diffraction
ECOSY – Exclusive correlation spectroscopie
ECT – Electrical capacitance tomography
EDAX – Energy-dispersive analysis of x-rays
EDMR – Electrically detected magnetic resonance, zie ESR of EPR
EDS of EDX – Energy dispersive X-ray spectroscopie, zie SEM
EELS – Elektronen energieverlies spectroscopie
EFM – Electrostatic force microscopy
EF-TEM – Energy filtered transmission electron microscopie, zie TEM
EID – Electron induced desorption
EIT en ERT – Elektrische impedantie-tomografie en elektrische weerstand tomografie
EIS – Elektrochemische impedantie-spectroscopie
EL – Elektroluminescentie
Ellipsometrie
Elektronenkristallografie
ELS – Electrophoretic light scattering
EM – Elektronenmicroscopie
ENDOR – Electron nuclear double resonance, zie ESR
EPMA – Elektronensonde-microanalyse of elektronenmicrosonde, zie SEM
EPR – Elektron paramagnetische resonantie spectroscopie, zie ESR
ERD of ERDA – Elastic recoil detection of elastic recoil detection analysis
ESCA – Elektronenspectroscopie voor chemische analyse, zie XPS
ESD – Electron stimulated desorption
ESEM – Environmental scanning elektronenmicroscopie, zie SEM
ESI-MS of ES-MS – Elektrospray-ionisatie massaspectrometrie of elektrospray massaspectrometrie
ESR – Elektronspinresonantie-spectroscopie
ESTM – Electrochemical scanning tunneling microscopie
ET – Elektronentomografie
EXAFS – Extended X-ray absorption fine structure
EXSY – Exchange spectroscopie

F

FCS – Fluorescentie correlatie spectroscopie
FCCS – Fluorescence cross-correlation spectroscopy
FEM – Field emission microscopy
FIB – Focused ion beam microscopy
FIM-AP – Field ion microscopy–atom probe
Flow birefringence
Fluorescence anisotropy
FLIM – Fluorescence lifetime imaging
FCM – Fluorescentiemicroscopie
FOSPM – Feature-oriented scanning probe microscopy, zie SPM
FRET – Förster resonance energy transfer
FRS – Forward Recoil Spectrometry, synoniem van ERD
FTICR – Fourier-transform ion cyclotron resonance, zie CR
FT-MS – Fourier-transform massaspectrometrie, zie MS
FTIR – Fourier-transform infraroodspectroscopie, zie IR

G

GC – Gaschromatografie
GC-MS – Gaschromatographie-massaspectrometrie, zie GC
GDMS – Glow discharge mass spectrometry
GDOS – Glow discharge optical spectroscopy
GISAXS – Grazing incidence small angle X-ray scattering
GIXD – Grazing incidence X-ray diffraction
GIXR – Grazing incidence X-ray reflectivity
GLC – Gas-vloeistofchromatografie, zie GC

H

HAADF – High angle annular dark-field imaging
HAS – Helium atom scattering
HPLC – High performance liquid chromatography
HREELS of HEELS – High resolution electron energy loss spectroscopy, zie EELS
HREM – High-resolution electron microscopy
HRTEM – High-resolution transmission electron microscopy
HI-ERDA – Heavy-ion elastic recoil detection analysis
HE-PIXE – High-energy proton induced X-ray emission

l

IAES – Ion induced Auger electron spectroscopy, zie AES
IBA – Ionenbundelanalyse
IBIC – Ion beam induced charge microscopie
ICP-AES – Inductively coupled plasma atomic emission spectroscopy
ICP-MS – Inductief gekoppelde plasmamassaspectrometrie
ICR – Ion cyclotron resonance
IETS – Inelastic electron tunneling spectroscopy
IGA – Intelligent gravimetric analysis
IGF – Inert gas fusion
IIX – Ion induced X-ray analysis, zie PIXE
Immunofluorescentiemicroscopie, zie FCM
INS – Ion neutralization spectroscopy
Inelastic neutron scattering
IRNDT – Infrared non-destructive testing of materials
IRR – Infraroodreflectografie
IRS – Infraroodspectroscopyie
ISS – Ion scattering spectroscopy
ITC – Isothermal titration calorimetry
IVEM – Intermediate voltage electron microscopy, zie EM

L

LALLS – Low-angle laser light scattering
LC – Vloeistofchromatografie
LC-MS – Vloeistof chromatografie-massaspectrometrie, zie LC
LEED – Laagenergetische elektrondiffractie
LEEM – Lage-energie elektronenmicroscopie
LEIS – Lage-energie ionenverstrooiing
LFM – Lateral force microscopy
LIBS – Laser induced breakdown spectroscopy
LOES – Laser optical emission spectroscopy
LS – Licht(Raman)verstrooiing of Ramanverstrooiing

M

MALDI – Matrix-assisted laser desorption/ionization
MBE – Molecular beam epitaxy
MEIS – Medium energy ion scattering
MFM – Magnetic force microscopy
MIT – Magnetic induction tomography
MPM – Multiphoton fluorescence microscopy
MRFM – Magnetic resonance force microscopy
MRI – Magnetic resonance imaging
MS – Massaspectrometrie
MS/MS – Tandem mass spectrometry, zie MS
MSGE – Mechanically stimulated gas emission
Mössbauerspectroscopie
MTA – Microthermische analyse

N

NAA – Neutronenactiveringsanalyse
ND – Neutronendiffractie
NDP – Neutron depth profiling
NEXAFS – Near edge X-ray absorption fine structure, synoniem van XANES
NIS – Nuclear inelastic scattering/absorption
NMR – Kernspinresonantie-spectroscopie
NOESY – Nuclear Overhauser effect spectroscopy
NRA – Nuclear reaction analysis
NSOM – Near-field optical microscopy

O

OBIC – Optical beam induced current
ODNMR – Optically detected magnetic resonance, zie ESR
OES – Optische emissie spectroscopie, synoniem met AES
OM – Optische microscopie
OM-TL – Optische microscopie met transmissie licht, zie OM
OM-RL – Optische microscopie met gereflecteerd licht, zie OM
Osmometry

P

PAS – Positron annihilation spectroscopy
Fotoacoustic spectroscopie
PAT of PACT – Fotoacoustische tomographie of photoacoustic computed tomography
PAX – Fotoemissie van geadsorbeerde xenon
PC of PCS – Photocurrent spectroscopy
Fasecontrastmicroscopie
PhD – Fotoelektronendiffractie
PD – Photodesorption
PDEIS – Potentiodynamic electrochemical impedance spectroscopy
PDS – Photothermal deflection spectroscopy
PED – Photoelectron diffraction
PEELS – Parallel elektronen energieverlies spectroscopie, zie EELS
PEEM – Fotoemissie elektronenmicroscopie of fotoelektron emissie microscopie
PES – Fotoelektronenspectroscopie
PINEM – photon-induced near-field electron microscopy
PIGE – Particle (or proton) induced gamma-ray spectroscopy, zie nuclear reaction analysis
PIXE – Particle (or proton) induced X-ray spectroscopy
PL – Fotoluminescentie
Porosimetrie
Poederdiffractie
PTMS – Photothermal microspectroscopy
PTS – Photothermal spectroscopy

Q

QENS – Quasielastic neutron scattering
QCM-D – Quartz crystal microbalance with dissipation monitoring

R

RS – Ramanspectroscopie
RAXRS – Resonant anomalous X-ray scattering
RBS – Rutherford backscattering spectrometrie
REM – Reflectie-elektronenmicroscopie, zie EM
RDS – Reflectance difference spectroscopy
RHEED – Reflection high-energy electron diffraction
RIMS – Resonance ionization mass spectrometry
RIXS – Resonant inelastic X-ray scattering
RR spectroscopy – Resonantie Ramanspectroscopie

S

SAD – Selected area diffraction
SAED – Selected area electron diffraction
SAM – Scanning Auger microscopy, zie AES
SANS – Small-angle neutron scattering
SAXS – Small-angle X-ray scattering
SCANIIR – Surface composition by analysis of neutral species en ion-impact radiation
SCEM – Scanning confocal electron microscopy
SCM – Scanning capacitance microscopy
SE – Spectroscopische ellipsometrie, zie ellipsometrie
SEC – Size exclusionchromatografie
SEIRA – Surface enhanced infrared absorption spectroscopy
SEM – rasterelektronenmicroscopie, scanning electron microscopy
SEI – Secondaire elektron imaging, zie SEM
SERS – Surface enhanced Raman spectroscopy
SERRS – Surface enhanced resonance Raman spectroscopy
SESANS – Spin Echo Small Angle Neutron Scattering
SEXAFS – Surface extended X-ray absorption fine structure
SICM – Scanning ion-conductance microscopy
SIL – Solid immersion lens
SIM – Solid immersion mirror
SIMS – Secondary ion mass spectrometry
SNMS – Sputtered neutral species mass spectrometry
SNOM – Scanning near-field optical microscopy
SPECT – Single-photon emission computed tomography-scan
SPM – Scanning probe microscopy
SRM-CE/MS – Selected-reaction-monitoring capillaire elektroforese massaspectrometrie
SSNMR – Solid-state nuclear magnetic resonance
Starkeffect-spectroscopie
STED – Stimulated emission depletion microscopy
STEM – Scanning transmission electron microscopy, zie TEM
STM – Scanning tunneling microscopy
STS – Scanning tunneling spectroscopy
SXRD – Surface X-ray diffraction, zie XRD

T

TAT of TACT – Thermoacoustisch tomografie of thermoacoustic computed tomography, zie PAT
TEM – Transmissie-elektronenmicroscopie
TGA – Thermogravimetric analysis
TIKA – Transmitting ion kinetic analysis
TIMS – Thermische ionisatie massaspectrometrie
TIRFM – Totale interne reflectie fluorescentie microscopie
TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy
TMA – Thermo-mechanische analyse
TOF-MS – Time-of-flight mass spectrometry
TPEF of 2PEF – Two-photon excitation microscopy
TXRF – Totale reflectie röntgenfluorescentie analyse, zie XRF

U

Ultrasound attenuation spectroscopy
UPS – UV-fotoelektron spectroscopie
USANS – Ultra small-angle neutron scattering
USAXS – Ultra small-angle X-ray scattering
UT – Ultrasoon onderzoek
UV/Vis – Ultraviolet/visible-spectroscopie

V

VEDIC – Video-enhanced differential interference contrast microscopy
Voltammetrie

W

WAXS – Wide angle X-ray scattering
WDX of WDS – Wavelength dispersive X-ray spectroscopy

X

XAES – Röntgen geïnduceerde Auger-elektronspectroscopie, zie AES
XANES – X-ray absorption fine structure, synoniem van NEXAFS
XAS – Röntgenabsorptie-spectroscopie
X-CTR – X-ray crystal truncation rod verstrooiing
Röntgenkristallografie
XDS – Röntgen diffuse verstrooiing
XPEEM – Röntgen fotoelektron emissie microscopie
XPS – Röntgenfotoelektron-spectroscopie
XRD – Röntgendiffractie
XRES – X-ray resonant exchange scattering
XRF – Röntgenfluorescentiespectrometrie
XRR – Röntgenreflectiviteit
XRS – Röntgen Raman verstrooiing
XSW – Röntgen staande golf techniek

Symbolen

μSR – zie muon-spinspectroscopie
χ – zie magnetische susceptibiliteit

Zie ook

Literatuur

Callister, WD (2000). Materials Science and Engineering – An Introduction. John Wiley and Sons, London. ISBN 0-471-32013-7.
Focused Ion Beam Systems: Basics and Applications. Cambridge University Press, Cambridge, UK (2007). ISBN 978-0-521-83199-4.