(Q50455654)
Statements
Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture (English)
1 reference
Elizabeth Schroeder-Reiter
1 reference
Fabián Pérez-Willard
1 reference
Ulrike Zeile
1 reference
Gerhard Wanner
1 reference
5 November 2008
1 reference
165
1 reference
2
1 reference
97-106
1 reference
Identifiers
1 reference