Overview
Sponsored by the International Association for Pattern Recognition, this journal is focused on publishing articles that cover all areas related to document analysis and recognition. This includes contributions dealing with computer recognition of characters, symbols, text, lines, graphics, images, handwriting, signatures, as well as automatic analyses of the overall physical and logical structures of documents, with the ultimate objective of a high-level understanding of their semantic content.
The International Journal on Document Analysis and Recognition (IJDAR) publishes articles of four primary types: original research papers, correspondence, overviews and summaries, and system descriptions. It also features special issues on active areas of research.
Currently indexed in:
Academic Search Alumni Edition, Academic Search Complete, Academic Search Premier, Bibliography of Linguistic Literature, Compendex, Compuscience, Computer Science Index, Current Abstracts, Current Contents/Engineering, Computing, and Technology, DBLP, Google, INSPEC, Journal Citation Reports/Science Edition, OCLC ArticleFirst Database, OCLC FirstSearch Electronic Collections Online, PASCAL, SCOPUS, Science Citation Index Expanded, Summon by Serial Solutions, TOC Premier.
- Editors-in-Chief
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- Koichi Kise,
- Daniel Lopresti,
- Simone Marinai
- Journal Impact Factor
- 1.8 (2023)
- 5-year Journal Impact Factor
- 2.4 (2023)
- Submission to first decision (median)
- 3 days
- Downloads
- 83,180 (2023)
Latest issue
September 2024 |Special Issue: Advanced Topics in Document Analysis and Recognition
Latest articles
Journal updates
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Proposals for Special Issues
Guidelines for IJDAR special issue papers and proposals
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Call for Papers: 2025 ICDAR - IJDAR journal track
Guest editors: Xu-Cheng Yin, Dimosthenis Karatzas, Daniel Lopresti
Submission deadline: 15 November 2024
Journal information
- Electronic ISSN
- 1433-2825
- Print ISSN
- 1433-2833
- Abstracted and indexed in
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- ACM Digital Library
- Baidu
- CLOCKSS
- CNKI
- CNPIEC
- Current Contents/Engineering, Computing and Technology
- DBLP
- Dimensions
- EBSCO
- EI Compendex
- Google Scholar
- INSPEC
- Japanese Science and Technology Agency (JST)
- Naver
- OCLC WorldCat Discovery Service
- Portico
- ProQuest
- SCImago
- SCOPUS
- Science Citation Index Expanded (SCIE)
- TD Net Discovery Service
- UGC-CARE List (India)
- Wanfang
- Copyright information