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Ha-Yong Yang

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2000 – 2009

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2009
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  - https://dblp.org/rec/journals/mr/ChoiYHKCL09
Chel-Jong Choi, Ha-Yong Yang, Hyo-Bong Hong, Jin-Gyu Kim, Sung-Yong Chang, Jouhahn Lee:
Characteristics of metal-oxide-semiconductor (MOS) device with Er metal gate on SiO₂ film. Microelectron. Reliab. 49(4): 463-465 (2009)

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