Showing 1–1 of 1 results for author: Rippstein, B

Design and Test of Wire-Scanners for SwissFEL

Authors: G. L. Orlandi, M. Baldinger, H. Brands, P. Heimgartner, R. Ischebeck, A. Kammerer, F. Löhl, R. Lüscher, P. Mohanmurthy, C. Ozkan, V. Schlott, L. Schulz, B. Rippstein, C. Seiler, S. Trovati, P. Valitutti, D. Zimoch

Abstract: The SwissFEL light-facility will provide coherent X-rays in the wavelength region 7-0.7 nm and 0.7-0.1 nm. In SwissFEL, view-screens and wire-scanners will be used to monitor the transverse profile of a 200/10pC electron beam with a normalized emittance of 0.4/0.2 mm.mrad and a final energy of 5.8 GeV. Compared to view screens, wire-scanners offer a quasi-non-destructive monitoring of the beam tra… ▽ More The SwissFEL light-facility will provide coherent X-rays in the wavelength region 7-0.7 nm and 0.7-0.1 nm. In SwissFEL, view-screens and wire-scanners will be used to monitor the transverse profile of a 200/10pC electron beam with a normalized emittance of 0.4/0.2 mm.mrad and a final energy of 5.8 GeV. Compared to view screens, wire-scanners offer a quasi-non-destructive monitoring of the beam transverse profile without suffering from possible micro-bunching of the electron beam. The main aspects of the design, laboratory characterization and beam-test of the SwissFEL wire-scanner prototype will be discussed. △ Less

Submitted 1 November, 2016; originally announced November 2016.

Comments: Proceedings of the 36th International Free Electron Laser Conference, 2014 (5 pages, 7 figures)

Report number: THP091, P. 948 - 951

Journal ref: ISBN 978-3-95450-133-5 (2014), http://accelconf.web.cern.ch/AccelConf/FEL2014/papers/proceed.pdf