Formation of high-aspect-ratio nanocavity in LiF crystal using a femtosecond of x-ray FEL pulse
Authors:
Sergey S. Makarov,
Sergey A. Grigoryev,
Vasily V. Zhakhovsky,
Petr Chuprov,
Tatiana A. Pikuz,
Nail A. Inogamov,
Victor V. Khokhlov,
Yuri V. Petrov,
Eugene Perov,
Vadim Shepelev,
Takehisa Shobu,
Aki Tominaga,
Ludovic Rapp,
Andrei V. Rode,
Saulius Juodkazis,
Mikako Makita,
Motoaki Nakatsutsumi,
Thomas R. Preston,
Karen Appel,
Zuzana Konopkova,
Valerio Cerantola,
Erik Brambrink,
Jan-Patrick Schwinkendorf,
István Mohacsi,
Vojtech Vozda
, et al. (8 additional authors not shown)
Abstract:
Sub-picosecond optical laser processing of metals is actively utilized for modification of a heated surface layer. But for deeper modification of different materials a laser in the hard x-ray range is required. Here, we demonstrate that a single 9-keV x-ray pulse from a free-electron laser can form a um-diameter cylindrical cavity with length of ~1 mm in LiF surrounded by shock-transformed materia…
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Sub-picosecond optical laser processing of metals is actively utilized for modification of a heated surface layer. But for deeper modification of different materials a laser in the hard x-ray range is required. Here, we demonstrate that a single 9-keV x-ray pulse from a free-electron laser can form a um-diameter cylindrical cavity with length of ~1 mm in LiF surrounded by shock-transformed material. The plasma-generated shock wave with TPa-level pressure results in damage, melting and polymorphic transformations of any material, including transparent and non-transparent to conventional optical lasers. Moreover, cylindrical shocks can be utilized to obtain a considerable amount of exotic high-pressure polymorphs. Pressure wave propagation in LiF, radial material flow, formation of cracks and voids are analyzed via continuum and atomistic simulations revealing a sequence of processes leading to the final structure with the long cavity. Similar results can be produced with semiconductors and ceramics, which opens a new pathway for development of laser material processing with hard x-ray pulses.
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Submitted 5 September, 2024;
originally announced September 2024.
Ptychographic X-ray Speckle Tracking with Multi Layer Laue Lens Systems
Authors:
Andrew James Morgan,
Kevin T. Murray,
Mauro Prasciolu,
Holger Fleckenstein,
Oleksandr Yefanov,
Pablo Villanueva-Perez,
Valerio Mariani,
Martin Domaracky,
Manuela Kuhn,
Steve Aplin,
Istwan Mohacsi,
Marc Messerschmidt,
Karolina Stachnik,
Yang Du,
Anja Burkhart,
Alke Meents,
Evgeny Nazaretski,
Hanfei Yan,
Xiaojing Huang,
Yong Chu,
Henry N. Chapman,
Saša Bajt
Abstract:
The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical s…
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The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical sensitivity. The penetrating power that makes x-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques that have enabled the fabrication of a series of highly focusing x-ray lenses, known as wedged multi layer Laue lenses. Improvements to the lens design and fabrication technique demands an accurate, robust, in-situ and at-wavelength characterisation method. To this end, we have developed a modified form of the speckle-tracking wavefront metrology method, the ptychographic x-ray speckle tracking method, which is capable of operating with highly divergent wavefields. A useful by-product of this method, is that it also provides high-resolution and aberration-free projection images of extended specimens. We report on three separate experiments using this method, where we have resolved ray path angles to within 4 nano-radians with an imaging resolution of 45nm (full-period). This method does not require a high degree of coherence, making it suitable for lab based x-ray sources. Likewise it is robust to errors in the registered sample positions making it suitable for x-ray free-electron laser facilities, where beam pointing fluctuations can be problematic for wavefront metrology.
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Submitted 28 March, 2020;
originally announced March 2020.
