Showing 1–5 of 5 results for author: Lambrick, S

A multi-detector neutral helium atom microscope

Authors: Chenyang Zhao, Sam M Lambrick, Nick A von Jeinsen, Yanke Yuan, Xiaolong Zhang, Aleksandar Radić, David J Ward, John Ellis, Andrew P Jardine

Abstract: Scanning helium microscopy (SHeM) is an emerging technique that uses a beam of neutral atoms to image and analyse surfaces. The low energies ($\sim$64 meV) and completely non-destructive nature of the probe particles provide exceptional sensitivity for studying delicate samples and thin devices, including 2D materials. To date, around five such instruments have been constructed and are described i… ▽ More Scanning helium microscopy (SHeM) is an emerging technique that uses a beam of neutral atoms to image and analyse surfaces. The low energies ($\sim$64 meV) and completely non-destructive nature of the probe particles provide exceptional sensitivity for studying delicate samples and thin devices, including 2D materials. To date, around five such instruments have been constructed and are described in the literature. All represent the first attempts at SHeM construction in different laboratories, and use a single detection device. Here, we describe our second generation microscope, which is the first to offer multi-detector capabilities. The new instrument builds on recent research into SHeM optimisation and incorporates many improved design features over our previous instrument. We present measurements that highlight some of the unique capabilities the instrument provides, including 3D surface profiling, alternative imaging modes, and simultaneous acquisition of images from a mixed species beam. △ Less

Submitted 17 October, 2024; originally announced October 2024.

Helium atom micro-diffraction as a characterisation tool for 2D materials

Authors: Nick von Jeinsen, Aleksandar Radic, Ke Wang, Chenyang Zhao, Vivian Perez, Yiru Zhu, Manish Chhowalla, Andrew Jardine, David Ward, Sam Lambrick

Abstract: We present helium atom micro-diffraction as an ideal technique for characterization of 2D materials due to its ultimate surface sensitivity combined with sub-micron spatial resolution. Thermal energy neutral helium scatters from the valence electron density, 2-3A above the ionic cores of a surface, making the technique ideal for studying 2D materials, where other approaches can struggle due to sma… ▽ More We present helium atom micro-diffraction as an ideal technique for characterization of 2D materials due to its ultimate surface sensitivity combined with sub-micron spatial resolution. Thermal energy neutral helium scatters from the valence electron density, 2-3A above the ionic cores of a surface, making the technique ideal for studying 2D materials, where other approaches can struggle due to small interaction cross-sections with few-layer samples. Sub-micron spatial resolution is key development in neutral atom scattering to allow measurements from device-scale samples. We present measurements of monolayer-substrate interactions, thermal expansion coefficients, the electron-phonon coupling constant and vacancy-type defect density on monolayer-MoS2. We also discuss extensions to the presented methods which can be immediately implemented on existing instruments to perform spatial mapping of these material properties. △ Less

Submitted 30 September, 2024; originally announced September 2024.

Comments: Draft version, 11 pages, 6 figures, 2 tables

Defect density quantification in monolayer MoS2 using helium atom micro-diffraction

Authors: Aleksandar Radic, Nick von Jeinsen, Ke Wang, Yiru Zhu, Ismail Sami, Vivian Perez, David Ward, Andrew Jardine, Manish Chhowalla, Sam Lambrick

Abstract: Sulfur vacancy defects mediate a wide range of optoelectronic properties in MoS2, with precise control of defect density allowing for tuneable optoelectronic devices. However, accurate measurement of defect density in monolayer and few-layer samples poses a challenge due to their small scattering cross-sections to photon or electron probes. Conventional lab-based techniques such as Raman and photo… ▽ More Sulfur vacancy defects mediate a wide range of optoelectronic properties in MoS2, with precise control of defect density allowing for tuneable optoelectronic devices. However, accurate measurement of defect density in monolayer and few-layer samples poses a challenge due to their small scattering cross-sections to photon or electron probes. Conventional lab-based techniques such as Raman and photoluminescence can infer approximate defect density in micro-scale samples via optoelectronic properties, but they require validation using stoichiometric beam-line XPS. We introduce an ultra-low energy (~64 meV) and non-intrusive lab-based technique to quantify the surface defect density in micron-scale monolayer MoS2. Here we show that a recently developed technique, helium atom micro-diffraction (referred to as scanning helium microscopy (SHeM) in literature), can be used to directly measure vacancy-type defect density in 2D materials by performing atom diffraction from a microscopic spot. SHeM uses a neutral, inert, and thermal energy probe of helium-4 atoms to measure ordered and disordered atom-surface scattering allowing the level of surface order to be inferred. The presented method enables rapid, non-damaging, and material-agnostic lab-based quantification of defect density in 2D materials, a crucial step towards the wider adoption of 2D semiconductors in devices. △ Less

Submitted 27 September, 2024; originally announced September 2024.

Comments: 15 pages, 7 figures

On the application of components manufactured with stereolithographic 3D printing in high vacuum systems

Authors: Aleksandar Radic, Sam Lambrick, Sam Rhodes, David Ward

Abstract: We report on a method for using stereolithographic (SLA) additive manufacturing to rapidly and cheaply prototype components for use in high-vacuum environments. We demonstrate the primary vacuum contaminant from freshly printed SLA plastics is water with no evidence of polymers out-gassing from the material and thus the vacuum performance can be controlled with simple treatments which do not invol… ▽ More We report on a method for using stereolithographic (SLA) additive manufacturing to rapidly and cheaply prototype components for use in high-vacuum environments. We demonstrate the primary vacuum contaminant from freshly printed SLA plastics is water with no evidence of polymers out-gassing from the material and thus the vacuum performance can be controlled with simple treatments which do not involve surface sealing. An unbaked vacuum system containing SLA printed parts achieved 1.9e-8 mbar base pressure whilst retaining structural integrity and manufacturing accuracy. Preliminary results indicate that our method can be extended to achieve ultrahigh-vacuum compatibility by baking at higher temperatures. We further report on the effect of atmospheric exposure to components and present evidence to suggest that re-wetting occurs exclusively in the component skin layer, by showing that the bulk mass changes of the material is irreversible on the timescale investigated (< 2 weeks). △ Less

Submitted 12 June, 2024; originally announced June 2024.

Comments: 5 pages, 4 figures. Poster presentation at EVC-17/ECOSS-37 (2024)

3D surface profilometry using neutral helium atoms

Authors: Aleksandar Radic, Sam M. Lambrick, Nick A. von Jeinsen, Andrew P. Jardine, David J. Ward

Abstract: Three-dimensional mapping of surface structures is important in a wide range of biological, technological, healthcare and research applications, including taxonomy, microfluidics and fabrication. Neutral helium atom beams have been established as a sensitive probe of topography and have already enabled structural information to be obtained from delicate samples, where conventional probes would cau… ▽ More Three-dimensional mapping of surface structures is important in a wide range of biological, technological, healthcare and research applications, including taxonomy, microfluidics and fabrication. Neutral helium atom beams have been established as a sensitive probe of topography and have already enabled structural information to be obtained from delicate samples, where conventional probes would cause damage. Here, we demonstrate empirical reconstruction of a complete surface profile using measurements from a scanning helium microscope (SHeM), using the heliometric stereo method and a single detector instrument geometry. Results for the surface profile of tetrahedral aluminum potassium sulphate crystals demonstrate the areas of surfaces and facet orientations can be recovered to within 5% of the expected values. △ Less

Submitted 14 May, 2024; v1 submitted 18 December, 2023; originally announced December 2023.

Comments: 7 pages (including bibliography), 5 figures (including Appendix). Published at Applied Physics Letters on 14th May 2024 (doi.org/10.1063/5.0206374)