Showing 1–1 of 1 results for author: Kirkland, E
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BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization
Authors:
Alexander J. Pattison,
Stephanie M. Ribet,
Marcus M. Noack,
Georgios Varnavides,
Kunwoo Park,
Earl Kirkland,
Jungwon Park,
Colin Ophus,
Peter Ercius
Abstract:
Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without interrupting on-going experiments. Here, we present an automated method of correcting first- and second-order aberrations called BEACON which uses Ba…
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Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without interrupting on-going experiments. Here, we present an automated method of correcting first- and second-order aberrations called BEACON which uses Bayesian optimization of the normalized image variance to efficiently determine the optimal corrector settings. We demonstrate its use on gold nanoparticles and a hafnium dioxide thin film showing its versatility in nano- and atomic-scale experiments. BEACON can correct all first- and second-order aberrations simultaneously to achieve an initial alignment and first- and second-order aberrations independently for fine alignment. Ptychographic reconstructions are used to demonstrate an improvement in probe shape and a reduction in the target aberration.
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Submitted 18 October, 2024;
originally announced October 2024.