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Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Authors:
Gianluca Aglieri Rinella,
Giacomo Alocco,
Matias Antonelli,
Roberto Baccomi,
Stefania Maria Beole,
Mihail Bogdan Blidaru,
Bent Benedikt Buttwill,
Eric Buschmann,
Paolo Camerini,
Francesca Carnesecchi,
Marielle Chartier,
Yongjun Choi,
Manuel Colocci,
Giacomo Contin,
Dominik Dannheim,
Daniele De Gruttola,
Manuel Del Rio Viera,
Andrea Dubla,
Antonello di Mauro,
Maurice Calvin Donner,
Gregor Hieronymus Eberwein,
Jan Egger,
Laura Fabbietti,
Finn Feindt,
Kunal Gautam
, et al. (69 additional authors not shown)
Abstract:
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise the sensor for the next generation of Monolithic Active Pixels Sensors for high-energy physics. The technology was explored in several variants which differed by: doping levels, pixel geometries and pixel pitches (10-25…
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Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise the sensor for the next generation of Monolithic Active Pixels Sensors for high-energy physics. The technology was explored in several variants which differed by: doping levels, pixel geometries and pixel pitches (10-25 $μ$m). These variants have been tested following exposure to varying levels of irradiation up to 3 MGy and $10^{16}$ 1 MeV n$_\text{eq}$ cm$^{-2}$. Here the results from prototypes that feature direct analogue output of a 4$\times$4 pixel matrix are reported, allowing the systematic and detailed study of charge collection properties. Measurements were taken both using $^{55}$Fe X-ray sources and in beam tests using minimum ionizing particles. The results not only demonstrate the feasibility of using this technology for particle detection but also serve as a reference for future applications and optimisations.
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Submitted 13 March, 2024;
originally announced March 2024.
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Commissioning and installation of the new small-Diameter Muon Drift Tube (sMDT) detectors for the Phase-I upgrade of the ATLAS Muon Spectrometer
Authors:
G. H. Eberwein,
O. Kortner,
H. Kroha,
M. Rendel,
P. Rieck,
D. Soyk,
E. Voevodina,
V. Walbrecht
Abstract:
The Monitored Drift Tubes, as a part of the ATLAS muon spectrometer, are precision drift chambers designed to provide excellent spatial resolution and high tracking efficiency independent of the track angle. Through the life of the LHC and ATLAS experiment, this detector has already demonstrated that they provide precise tracking over large areas. The aim of the ATLAS muon spectrometer upgrade is…
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The Monitored Drift Tubes, as a part of the ATLAS muon spectrometer, are precision drift chambers designed to provide excellent spatial resolution and high tracking efficiency independent of the track angle. Through the life of the LHC and ATLAS experiment, this detector has already demonstrated that they provide precise tracking over large areas. The aim of the ATLAS muon spectrometer upgrade is to increase the muon trigger efficiency, precise muon momentum measurement and to improve the rate capability of the muon system in the high-background regions during the High-Luminosity LHC runs. To meet these requirements, the proposed solution is based on the small (15 mm) diameter Muon Drift Tube chamber (sMDT) technology. The new detector provides about an order of magnitude higher rate capability and allows for the installation of additional new triplet Resistive Plate Chambers (RPCs) trigger detectors in the barrel inner layer of the muon system. A pilot project for the barrel inner layer upgrade is underway during the 2019/21 LHC shutdown. For this reason, the Max-Planck-Institute for Physics in Munich has built 16 sMDT chambers, each will cover an area of about 2.5 $m^{2}$. To ensure their proper operation in the experiment, the sMDT detectors have to pass a set of stringent tests both at the production site and after their delivery at CERN. After their installation in the ATLAS muon spectrometer, the muon stations are further tested and commissioned with cosmic rays. The author will describe the detector design, the quality assurance and certification path, as well as will present the experience with the chamber tests, the integration procedure and installation of the muon stations in the ATLAS experiment.
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Submitted 13 December, 2021;
originally announced December 2021.
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Performance of the new Readout Electronics for the ATLAS (s)MDT Chambers and Future Colliders at High Background Rates
Authors:
G. H. Eberwein,
O. Kortner,
H. Kroha,
E. Voevodina
Abstract:
Small-diameter Drift Tube (sMDT) detectors with 15 mm tube diameter have proven to be excellent candidates for precision muon tracking detectors in experiments at future hadron colliders like HL-LHC and FCC-hh where unprecedentedly high background rate capabilities are required. sMDT chambers are currently being installed in the inner barrel layer of the ATLAS muon spectrometer. The rate capabilit…
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Small-diameter Drift Tube (sMDT) detectors with 15 mm tube diameter have proven to be excellent candidates for precision muon tracking detectors in experiments at future hadron colliders like HL-LHC and FCC-hh where unprecedentedly high background rate capabilities are required. sMDT chambers are currently being installed in the inner barrel layer of the ATLAS muon spectrometer. The rate capability of the sMDT drift tubes in terms of muon detection efficiency and spatial resolution is limited by the performance of the readout electronics. A new (s)MDT ASD (Amplifier-Shaper-Discriminator) readout chip for use at the HL-LHC and future hadron colliders with a faster peaking time compared to the old chip has been developed, reducing the discriminator threshold crossing time jitter and thus improving the time- and spatial resolution with and without $γ$-background radiation. Additionally, a method compensating the gas gain drop due to space charge at high $γ$-background hit flux by adjusting the sMDT operating voltage will be presented. Simulations show, that the addition of active baseline restoration circuits in the front-end electronics chips in order to suppress signal-pile-up effects at high counting rates further leads to significant improvement of both efficiency and resolution. Extensive tests using sMDT test chambers have been performed at the CERN Gamma Irradiation Facility (GIF++). Chambers equipped with new readout chips with improved pulse shaping and discrete readout circuits with baseline restoring functionality have been tested.
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Submitted 9 December, 2021;
originally announced December 2021.
